Document Type : Regular Articles
Authors
1
Physics Department, Faculty of Science, Assiut University, Assiut 71516, Egypt.
2
Physics Department, College of Sciences and Art At ArRass, Qassim University, ArRass 51921, Kingdom of Saudi Arabia.
3
Physics Department, Faculty of Science, Sohag University, Sohag 82524, Egypt.
4
Physics Department, Faculty of Science, Northern Border University, Arar 91431, Kingdom of Saudi Arabia.
5
Physics Department, Faculty of Science, Al-Azhar University, Assiut 71542, Egypt.
Abstract
The crystalline structure characteristics, morphological (through SEM), and magnetic properties of Zn1-xFexO thin films produced by the sol-gel spin coating process on glass substrates were examined to gain a better understanding of the effects of Fe in ZnO (x=0.0, 0.05, 0.10, 0.15, and 0.20). X-ray diffraction (XRD) and energy dispersive analysis X-ray techniques are used to explore the impact of Fe doping on the structural ZnO nanocrystalline films (EDAX). In order to investigate the XRD patterns of Zn1-xFexO, The XRD data demonstrated that Fe ions successfully replaced the Zn2+ lattice positions after Zn2+ replacement without causing any appreciable structural change, and their crystallinity decreased with increasing Fe doping level. Additionally, the XRD investigation supported the hexagonal wurtzite structure's purity. Calculations have been made for the lattice constants, cell volume, atomic packing fraction, and surface density. Zn1-xFexO thin films' microstructural characteristics, crystallite size, and lattice strain were computed. The changes in microstructural parameters were discussed in detail as a function of Fe concentration. The Zn–O bond lengths and bond angle of Zn1-xFexO were determined and have changed. Magnetization measurements using a vibrating sample magnetometer revealed hysteresis loops in Fe-doped ZnO films and confirmed ferromagnetism at room temperature.
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